Biased HAST & PCT Pressure Cooker Test System | JEDEC JESD22-A110 Compliant

The advanced biased HAST & PCT pressure cooker test system from Wewon Environmental Chambers Co., Ltd. designed for JEDEC JESD22-A110 compliance. In the rapidly evolving field of microelectronics, ensuring the durability of non-hermetic packages is critical. Our newly developed Biased HAST & PCT Pressure Cooker Test System is a dual-mode environmental chamber engineered to accelerate moisture penetration and identify failure mechanisms such as ion migration and dielectric breakdown.

The Wewon biased HAST & PCT pressure cooker test system’s performance equivalent to Hirayama PC-422R8. Features unsaturated vapor pressure control for ion migration testing. This system is the result of our latest R&D initiative to optimize the structural integrity and thermal stability of traditional HAST equipment. It is fully compliant with the rigorous JEDEC JESD22-A110 standard, offering a robust solution for engineers seeking a high-performance alternative to legacy models like the Hirayama PC-422R8.

Equipment Model	JEDEC-JESD22-A110
Product Name	Biased HAST & PCT Pressure Cooker Test System
Standard Compliance	JEDEC JESD22-A110 (Biased), JESD22-A118 (Unbiased), IEC 60068-2-66
Two Test Modes	Unsaturated Vapor Pressure (HAST) / Saturated Steam (PCT)
Temperature Range	+105°C to +162.2°C (HAST) / +105°C to +142.9°C (PCT)
Humidity Range	75% ~ 100% R.H. (Precision Control)
Pressure Range	0.020 ~ 0.196 MPa (Gauge Pressure)
The Bias Terminals	High-reliability Terminals for Electrical Loading (Customizable Count)
Chamber Material	SUS#316 Stainless Steel (Electropolished for Corrosion Resistance)
Controller System	Programmable Touch Screen with Remote Data Logging

The biased HAST & PCT pressure cooker test system serves as a critical verification tool across multiple high-tech industries. In semiconductor manufacturing, It is indispensable for evaluating the moisture integrity of non-hermetic packages, specifically analyzing mold compounds for delamination and lead frames for corrosion susceptibility. For the Automotive Electronics sector, the system is essential for validating components against rigorous AEC-Q100 standards, ensuring they can withstand the harsh temperature-humidity extremes found in modern vehicles.

In the realm of PCB & PCBA manufacturing, It provides precise assessment of solder mask durability and Surface Insulation Resistance (SIR), helping to predict risks of electrochemical migration (ECM) under high pressure. Additionally, researchers in Material Science utilize this system for the accelerated aging of polymers, adhesives, and varnishes to predict long-term degradation behaviors. Unlike single-function autoclaves, Our system offers versatile testing capabilities to cover the full spectrum of accelerated life testing:

For engineers adhering to established industry habits, the “Pressure Cooker Test” (PCT) remains a vital benchmark.	1. PCT Pressure Cooker Test Chamber (Saturated Mode)
Function: Delivers 100% RH saturation at elevated temperatures (up to 142.9°C).
Application: Ideal for identifying “popcorn” effects in plastic packaging and moisture absorption limits in PCBs.
Key Advantage: Our optimized pressure vessel design ensures rapid saturation recovery, maintaining strict adherence to standard PCT protocols.
Meeting the requirements of JEDEC JESD22-A110, this mode allows for the application of electrical bias under controlled, non-condensing humidity.	2. Biased HAST Mode (Unsaturated Vapor Pressure)
Precision Control: Maintains humidity levels between 75% and 100% RH while applying voltage to the device under test (DUT).
Ion Migration Analysis: Specifically designed to detect electrochemical migration (ECM) and dendritic growth between conductive paths, a critical failure mode in modern high-density ICs.
Structural Upgrade: We have improved the signal terminal layout compared to traditional designs, ensuring better signal integrity and reducing the risk of leakage currents during high-voltage testing.

Why Choose Our New HAST System ? We understand that the Hirayama PC-422R8 has long been an industry reference. Our new system matches its critical performance parameters—chamber size, temperature ramp rates, and pressure control – Ensuring that your test data remains consistent and comparable with historical records. You get the same trusted performance with a modernized mechanical structure.

●	Our latest R&D breakthrough focuses on user safety and thermal efficiency: Double-Layer Insulation: Minimizes surface heat loss, ensuring excellent temperature uniformity () inside the test zone.
●	Ergonomic Loading: A redesigned basket and rack system makes loading complex PCBs and semiconductor fixtures easier and safer. Advanced Safety Interlocks: Features redundant over-pressure and over-temperature protection, exceeding basic CE requirements.

●	Q: What is the difference between a PCT Pressure Cooker Test Chamber and a HAST Chamber ?
●	A: A PCT chamber typically runs at 100% RH (saturation), while a HAST chamber can control humidity below saturation (e.g., 85% RH) to prevent condensation. Our system combines both functions, fully complying with JEDEC JESD22-A110.
●	Q: Can this machine perform the same tests as the Hirayama PC-422R8 ?
●	A: Yes. Our system is designed with identical test zone dimensions and performance specifications to the PC-422R8, allowing for seamless data correlation and method transfer.
●	Q: Why is “Biased” testing important ?
●	A: Applying electrical bias during humidity stress accelerates electrochemical failure modes like Ion Migration. This is essential for modern, fine-pitch electronics where standard unbiased testing (PCT) might miss latent defects.